메뉴 건너뛰기




Volumn 80, Issue 16, 2008, Pages 6235-6244

Effects of metal nanoparticles on the secondary ion yields of a model alkane molecule upon atomic and polyatomic projectiles in secondary ion mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ATOMS; GOLD; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; HYDROCARBONS; MASS SPECTROMETRY; METALS; NANOPARTICLES; NANOSTRUCTURES; PARAFFINS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILVER;

EID: 50049099488     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac800568y     Document Type: Article
Times cited : (26)

References (59)
  • 2
    • 50049104653 scopus 로고    scopus 로고
    • Vickerman, J. C, Briggs, D, Eds, Surface Spectra/IMP Publications: Chichester, U.K, Chapter 1
    • Vickerman, J. C. In ToF-SIMS: Surface Analysis by Mass Spectrometry; Vickerman, J. C., Briggs, D., Eds.; Surface Spectra/IMP Publications: Chichester, U.K., 2001; Chapter 1.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry
    • Vickerman, J.C.1
  • 19
    • 50049135132 scopus 로고    scopus 로고
    • Sigmund, P. In Sputtering by Particle Bombardment I; Behrisch, R., Ed.; Topics in Applied Physics, 47; Springer: New York, 1981.
    • Sigmund, P. In Sputtering by Particle Bombardment I; Behrisch, R., Ed.; Topics in Applied Physics, Vol. 47; Springer: New York, 1981.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.