Influence of the Organic Layer Thickness in (Metal-Assisted) Secondary Ion Mass Spectrometry Using Ga+ and C60+ Projectiles

Journal of the American Society for Mass Spectrometry

Volumn 20, Issue 12, 2009, Pages 2294-2303

  Wehbe, Nimer ^a   Mouhib, Taoufiq ^a   Prabhakaran, Aneesh ^a   Bertrand, Patrick ^a   Delcorte, Arnaud ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENT SUBSTRATES; ENERGY DEPOSITION MECHANISM; ION YIELDS; META-SIMS; METALLIZED LAYERS; MOLECULAR ION YIELD; MONOLAYER COVERAGE; ORGANIC FILMS; ORGANIC LAYERS; POLYATOMICS; YIELD ENHANCEMENT;

GOLD; GOLD DEPOSITS; IONS; MASS SPECTROMETERS; METALLIZING; MONOLAYERS; POLYSTYRENES; PROJECTILES; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY; SUBSTRATES;

GALLIUM ALLOYS;

CARBON; GALLIUM; GOLD; OLIGOMER; POLYSTYRENE; SILICON;

ARTICLE; CONTROLLED STUDY; ELLIPSOMETRY; EVAPORATION; MASS SPECTROMETRY; METALLATION; POLYMERIZATION; THICKNESS;

EID: 70449486703     PISSN: 10440305     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jasms.2009.08.022     Document Type: Article

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