Interpretation of static secondary ion spectra

Surface and Interface Analysis

Volumn 36, Issue 3, 2004, Pages 264-274

  Spool, A M ^a  

^a SAN JOSE RESEARCH CENTER   (United States)

Author keywords

SIMS; Static SIMS

Indexed keywords

CHROMATOGRAPHY; COMPOSITION; DATABASE SYSTEMS; ELECTRONS; IONIZATION; PROBLEM SOLVING; SAMPLING; SECONDARY ION MASS SPECTROMETRY; SENSITIVITY ANALYSIS;

SECONDARY IONS; STATIC SIMS;

POSITIVE IONS;

EID: 1842664927     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1685     Document Type: Article

References (41)

1. Mclafferty FW, Turecek F. Interpretation of Mass Spectra (4th edn). University Science Books: Sausalito, CA, 1993.
2. Delcorte A, Bertrand P. Nucl. Instrum. Methods B 1996; 115: 246.
3. Delcorte A, Bertrand P. Nucl. Instrum. Methods B 1996; 117: 235.
4. Delcorte A, Bertrand P. In Secondary Ion Mass Spectrometry SIMS X Proceedings, Benninghoven A, Hagenhoff B, Werner HW (eds). John Wiley: New York, 1997; 731.
5. Delcorte A, Segda BG, Bertrand P. Surf. Sci. 1997; 381: 18.
6. Delcorte A, Segda BG, Bertrand P. Surf. Sci. 1997; 389: 393.
7. Delcorte A, Bertrand P. Nucl. Instrum. Methods B 1998; 135: 430.
8. Delcorte A, Bertrand P. Surf. Sci. 1998; 413: 97.
9. Delcorte A, Bertrand P. Int. J. Mass Spectrom. 1999; 184: 217.
10. Delcorte A, Vanden Eynde X, Bertrand P, Reich DF. Int. J. Mass Spectrom. 1999; 189:133 (1999).
11. Delcorte A, Vanden Eynde X, Bertrand P, Reich DF. Nucl. Instrum. Methods Phys. Res. B 1999; 157:138.
12. Liu KSS, Yong CW, Garrison BJ, Vickerman JC. J. Phys. Chem. 1999; 103: 3195.
13. Taylor RS, Garrison BJ. Langmuir 1995; 11:1220.
14. Taylor RS, Garrison BJ. Int. J. Mass Spectrom. Ion Process 1995; 143: 255.
15. Taylor RS, Garrison BJ. Chem. Phys. Lett. 1994; 230: 495.
16. Taylor RS, Garrison BJ. J. Am. Chem. Soc. 1994; 116:4465.
17. Taylor RS, Brummel CL, Winograd N, Garrison BJ, Vickerman JC. Chem. Phys. Lett. 1995; 233: 575.
18. Winograd N, Garrison BJ. Int. J. Mass Spectrom. 2001; 212: 467.
19. Townes JA, White AK, Wiggins EN, Krantzman EN, Garrison BJ, Winograd N. J. Phys. Chem. 1999; 103: 4587.
20. Bertrand P, Delcorte A, Garrison BJ. Appl. Surf. Sci. 2003; 203-204: 160.
21. Delcorte A, Garrison BJ. J. Phys. Chem. B 2003; 107: 2297.
22. Delcorte A, Bertrand P, Garrison BJ. Appl. Surf. Sci. 2003; 203-204: 166.
23. Krantzman KD, Fenno R, Delcorte A, Garrison BJ. Nucl. Instrum. Methods B 2003; 202: 201.
24. Kotter F, Benninghoven A. Appl. Surf. Sci. 1998; 133: 47.
25. Stapel D, Brox A, Benninghoven A. Appl. Surf. Sci. 1999; 140:156.
26. Delcorte A, Wojciechowski I, Gonze X, Garrison BJ, Bertrand P. Int. J. Mass Spectrom. 2002; 214: 213.
27. Wojciechowski I, Delcorte A, Gonze X, Bertrand P. Appl. Surf. Sci. 2003; 203-204: 102.
28. Spool AM, Kasai PH. Macromolecules 1996; 29:1691.
29. Kasai PH, Spool AM. J. Phys. Chem. B 1998; 102: 7331.
30. Schueler B, Sander P, Reed DA. Vacuum 1986; 36:1005.
31. Schueler B. Microsc. Microanal. Microstruct. 1992; 3:1.
32. Briggs D, Hearn MJ. Vacuum 1986; 36:1005.
33. NIST EI Mass Spectrum Database.
34. Man N, Karen A, Shimizu A, Ishitani A. In Secondary Ion Mass Spectrometry SIMS XII Proceedings Benninghoven A, Bertrand P, Migeon H-N, Werner HW (eds). John Wiley: New York, 2000; 765.
35. Gilmore IS, Seah MP. Appl. Surf. Sci. 2000; 161: 465.
36. Gilmore IS, Seah MP, Johnstone JE. In Secondary Ion Mass Spectrometry SIMS XII Proceedings, Benninghoven A, Bertrand P, Migeon H-N, Werner HW (eds). John Wiley: New York, 2000; 801.
37. Gilmore IS, Seah MP. Appl. Surf. Sci. 2003; 203: 551.
38. Briggs D, Brown A, Vickerman JC. Handbook of Static Secondary Ion Mass Spectrometry, John Wiley: Chichester, 1989; 62.
39. Cooks RG, Ast T, Mabud A. Int. J. Mass Spectrum. 1990; 100: 209.
40. Schneiders A, Mollers R, Benninghoven A. Surf. Sci. 2001; 471: 170.
41. Ruschenschmidt K, Schnieders A, Benninghoven A, Arlinghaus HF. Surf. Sci. 2003; 526: 351.