SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 570, Issue 1-2, 2004, Pages 78-97

Maximizing information obtained from secondary ion mass spectra of organic thin films using multivariate analysis

(4) Wagner, M S a,d Graham, D J b Ratner, B D b,c Castner, David G b,c

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b University of Washington (United States)

c UNIVERSITY OF WASHINGTON (United States)

d PROCTER AND GAMBLE COMPANY (United States)

Author keywords

Biological compounds; Secondary ion mass spectroscopy; Self assembly

Indexed keywords

DATA REDUCTION; INFORMATION ANALYSIS; LEAST SQUARES APPROXIMATIONS; OPTIMIZATION; PRINCIPAL COMPONENT ANALYSIS; PROBLEM SOLVING; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLY;

BIOLOGICAL COMPOUNDS; ORGANIC MATERIALS; ORGANIC THIN FILMS; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROSCOPY (TOF SIMS);

THIN FILMS;

EID: 5144229668 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2004.06.184 Document Type: Conference Paper

Times cited : (135)

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