An in situ fracture device to image lipids in single cells using ToF-SIMS

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 257-260

  Lanekoff, Ingela ^a   Kurczy, Michael E ^a,b   Adams, Kelly L ^a,b   Malm, Jakob ^c   Karlsson, Roger ^a   Sjövall, Peter ^c   Ewing, Andrew G ^a,b  

^a UNIVERSITY OF GOTHENBURG   (Sweden)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

^c SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

Author keywords

freeze fracture; PC12 cells; phospholipids; ToF SIMS imaging

Indexed keywords

CLUSTER ION SOURCES; CLUSTER SIMS; FRACTURE PLANE; FREEZE FRACTURE; HIGH RESOLUTION IMAGE; IN-SITU; IN-VACUUM; PC12 CELLS; SANDWICH GEOMETRY; SINGLE CELLS; SPATIAL DISTRIBUTION; SUBMICRON RESOLUTION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; TOF-SIMS ANALYSIS; TOF-SIMS IMAGING;

CYTOLOGY; FRACTURE; ION SOURCES; IONS; PHOSPHOLIPIDS; SECONDARY ION MASS SPECTROMETRY; VACUUM;

CELLS;

EID: 78951472969     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3542     Document Type: Conference Paper

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