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Volumn 10, Issue 7, 2010, Pages 4448-4453

50-nm local anodic oxidation technology of semiconductor heterostructures

Author keywords

Local Anodic Oxidation; Nano Scale Devices; Semiconductor Heterostructure

Indexed keywords

HALL PROBE; HETEROSTRUCTURES; LINE PATTERN; LOCAL ANODIC OXIDATION; LOW-MOBILITY; MAGNETIC-FIELD RESOLUTION; NANO-DEVICES; NANOSCALE DEVICE; QUANTIZED CONDUCTANCE; QUANTUM POINT CONTACT; ROOM TEMPERATURE; SEMICONDUCTOR HETEROSTRUCTURE; SEMICONDUCTOR HETEROSTRUCTURES; SENSITIVITY OF THE PROBE; SUBMICROMETERS; TRANSPORT MEASUREMENTS; ZERO MAGNETIC FIELDS;

EID: 79955409364     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2010.2362     Document Type: Conference Paper
Times cited : (1)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.