Magnetic field and temperature dependence of an atomic force microscope-defined quantum point contact

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 22, Issue 2, 2004, Pages 570-573

  Mori, G ^a,b   Lazzarino, M ^a   Ercolani, D ^a   Biasiol, G ^a   Sorba, L ^a,c  

^a LABORATORIO TASC   (Italy)

^b UNIVERSITY OF TRIESTE   (Italy)

^c UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTANCE; ELECTRIC POTENTIAL; FUNCTIONS; MAGNETIC FIELDS; OXIDATION; THERMAL EFFECTS;

MESOSCOPIC SYSTEMS; QUANTUM POINT CONTACTS (QPC); RESONANCE FREQUENCY; TEMPERATURE DEPENDENCE;

SEMICONDUCTOR QUANTUM DOTS;

EID: 2342454469     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1648065     Document Type: Article

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