Effect of Pd content on crystallization and shape memory properties of Ti-Ni-Pd thin films

International Journal of Smart and Nano Materials

Volumn 2, Issue 1, 2011, Pages 9-21

  Kim, Hee Young ^a   Yuan, Yimin ^a   Nam, Tae Hyun ^b   Miyazaki, Shuichi ^a,b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b Gyeongsang National University   (South Korea)

Author keywords

Crystallization; Martensitic phase transformation; Shape memory alloy; Sputtering; Thin film

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS FILMS; ANNEALING; CRYSTALLIZATION; DEPOSITION; MARTENSITIC TRANSFORMATIONS; PALLADIUM; SHAPE MEMORY EFFECT; SPUTTERING; TERNARY ALLOYS; TITANIUM ALLOYS;

AMORPHOUS THIN FILMS; AS-DEPOSITED THIN FILMS; CRITICAL STRESS; CRYSTALLIZATION PROCESS; CRYSTALLIZATION TEMPERATURE; MARTENSITIC PHASE TRANSFORMATIONS; RECOVERY STRAIN; SHAPE-MEMORY PROPERTIES;

THIN FILMS;

EID: 79955388143     PISSN: 19475411     EISSN: 1947542X     Source Type: Journal    
DOI: 10.1080/19475411.2010.550655     Document Type: Article

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