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Applied Physics Letters

Volumn 98, Issue 12, 2011, Pages

Low-voltage ZnO thin-film transistors based on Y2 O3 and Al2 O3 high- k dielectrics deposited by spray pyrolysis in air

(5) Adamopoulos, George a Thomas, Stuart a Bradley, Donal D C a McLachlan, Martyn A a Anthopoulos, Thomas D a

a IMPERIAL COLLEGE LONDON (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD-EFFECT; HIGH-K DIELECTRIC; IMPEDANCE SPECTROSCOPY; LOW-LEAKAGE CURRENT; LOW-VOLTAGE; ON/OFF RATIO; OXIDE ELECTRONICS; POLYCRYSTALLINE; PROCESSING METHOD; UV-VISIBLE ABSORPTION SPECTROSCOPY; ZNO; ZNO TRANSISTORS;

ABSORPTION SPECTROSCOPY; ALUMINUM; AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ELECTRON MOBILITY; LEAKAGE CURRENTS; THIN FILM TRANSISTORS; ZINC OXIDE;

SPRAY PYROLYSIS;

EID: 79953885624 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3568893 Document Type: Article

Times cited : (127)

References (28)

1
- 84891584766
- (Wiley, New York). 10.1002/9780470710609
- A. Facchetti and T. Marks, Transparent Electronics: From Synthesis to Applications (Wiley, New York, 2010). 10.1002/9780470710609
- (2010) Transparent Electronics: From Synthesis to Applications
- Facchetti, A.¹ Marks, T.²

2
- 67649252663
- 0935-9648, 10.1002/adma.200803584
- A. Bashir, P. H. Wöbkenberg, J. Smith, J. M. Ball, G. Adamopoulos, D. D. C. Bradley, and T. D. A. Anthopoulos, Adv. Mater. (Weinheim, Ger.) 0935-9648 21, 2226 (2009). 10.1002/adma.200803584
- (2009) Adv. Mater. (Weinheim, Ger.) , vol.21 , pp. 2226
- Bashir, A.¹ Wöbkenberg, P.H.² Smith, J.³ Ball, J.M.⁴ Adamopoulos, G.⁵ Bradley, D.D.C.⁶ Anthopoulos, T.D.A.⁷

3
- 77955034321
- 0002-7863, 10.1021/ja100615r
- M. -G. Kim, H. S. Kim, Y. -G. Ha, J. He, M. G. Kanatzidis, A. Facchetti, and T. J. Marks, J. Am. Chem. Soc. 0002-7863 132, 10352 (2010). 10.1021/ja100615r
- (2010) J. Am. Chem. Soc. , vol.132 , pp. 10352
- Kim, M.-G.¹ Kim, H.S.² Ha, Y.-G.³ He, J.⁴ Kanatzidis, M.G.⁵ Facchetti, A.⁶ Marks, T.J.⁷

4
- 77954732129
- 10.1021/jp1018789
- H. Liu, J. Sun, Q. Tang, and Q. Wan, J. Phys. Chem. C 114, 12316 (2010). 10.1021/jp1018789
- (2010) J. Phys. Chem. C , vol.114 , pp. 12316
- Liu, H.¹ Sun, J.² Tang, Q.³ Wan, Q.⁴

5
- 77956070963
- 0002-7863, 10.1021/ja9103155
- J. Liu, D. B. Buchholz, J. W. Hennek, R. P. H. Chang, A. Facchetti, and T. J. Marks, J. Am. Chem. Soc. 0002-7863 132, 11934 (2010). 10.1021/ja9103155
- (2010) J. Am. Chem. Soc. , vol.132 , pp. 11934
- Liu, J.¹ Buchholz, D.B.² Hennek, J.W.³ Chang, R.P.H.⁴ Facchetti, A.⁵ Marks, T.J.⁶

6
- 70350468172
- 1476-1122, 10.1038/nmat2560
- B. N. Pal, B. M. Dhar, K. C. See, and H. E. Katz, Nature Mater. 1476-1122 8, 898 (2009). 10.1038/nmat2560
- (2009) Nature Mater. , vol.8 , pp. 898
- Pal, B.N.¹ Dhar, B.M.² See, K.C.³ Katz, H.E.⁴

7
- 0032645835
- 10.1147/rd.433.0383 0018-8646
- S. A. Campbell, H. S. Kim, D. C. Gilmer, B. He, T. Ma, and W. L. Gladfelter, IBM J. Res. Develop. 43, 383 (1999). 10.1147/rd.433.0383 0018-8646
- (1999) IBM J. Res. Develop. , vol.43 , pp. 383
- Campbell, S.A.¹ Kim, H.S.² Gilmer, D.C.³ He, B.⁴ Ma, T.⁵ Gladfelter, W.L.⁶

8
- 0000125857
- 0003-6951, 10.1063/1.119683
- S. C. Choi, M. H. Cho, S. W. Whangho, C. N. Whang, S. B. Kang, S. I. Lee, and M. Y. Lee, Appl. Phys. Lett. 0003-6951 71, 903 (1997). 10.1063/1.119683
- (1997) Appl. Phys. Lett. , vol.71 , pp. 903
- Choi, S.C.¹ Cho, M.H.² Whangho, S.W.³ Whang, C.N.⁴ Kang, S.B.⁵ Lee, S.I.⁶ Lee, M.Y.⁷

9
- 0032256250
- 0163-1918.
- L. Manchanda, W. H. Lee, J. E. Bower, F. H. Baumann, W. L. Brown, C. J. Case, R. C. Keller, Y. O. Kim, E. J. Laskowski, M. D. Morris, R. L. Opila, I. J. Silverman, T. W. Sorsch, and G. R. Weber, Tech. Dig.-Int. Electron Devices Meet. 0163-1918 1998, 605.
- Tech. Dig. - Int. Electron Devices Meet. , vol.1998 , pp. 605
- Manchanda, L.¹ Lee, W.H.² Bower, J.E.³ Baumann, F.H.⁴ Brown, W.L.⁵ Case, C.J.⁶ Keller, R.C.⁷ Kim, Y.O.⁸ Laskowski, E.J.⁹ Morris, M.D.¹⁰ Opila, R.L.¹¹ Silverman, I.J.¹² Sorsch, T.W.¹³ Weber, G.R.¹⁴

10
- 69049116282
- 0003-6951, 10.1063/1.3204465
- R. Engel-Herbert, Y. Hwang, J. Cagnon, and S. Stemmer, Appl. Phys. Lett. 0003-6951 95, 062908 (2009). 10.1063/1.3204465
- (2009) Appl. Phys. Lett. , vol.95 , pp. 062908
- Engel-Herbert, R.¹ Hwang, Y.² Cagnon, J.³ Stemmer, S.⁴

11
- 0000551766
- 0003-6951, 10.1063/1.124036
- G. D. Wilk and R. M. Wallace, Appl. Phys. Lett. 0003-6951 74, 2854 (1999). 10.1063/1.124036
- (1999) Appl. Phys. Lett. , vol.74 , pp. 2854
- Wilk, G.D.¹ Wallace, R.M.²

12
- 0001624638
- 0003-6951, 10.1063/1.125673
- G. D. Wilk and R. M. Wallace, Appl. Phys. Lett. 0003-6951 76, 112 (2000). 10.1063/1.125673
- (2000) Appl. Phys. Lett. , vol.76 , pp. 112
- Wilk, G.D.¹ Wallace, R.M.²

13
- 84975341279
- 0013-4651, 10.1149/1.2129243
- M. Balog, M. Schieber, M. Michman, and S. Patai, J. Electrochem. Soc. 0013-4651 126, 1203 (1979). 10.1149/1.2129243
- (1979) J. Electrochem. Soc. , vol.126 , pp. 1203
- Balog, M.¹ Schieber, M.² Michman, M.³ Patai, S.⁴

14
- 0000081968
- 0003-6951, 10.1063/1.125519
- T. M. Klein, D. Niu, W. S. Epling, W. Li, D. M. Maher, C. C. Hobbs, R. I. Hedge, I. J. R. Baumvol, and G. N. Parsons, Appl. Phys. Lett. 0003-6951 75, 4001 (1999). 10.1063/1.125519
- (1999) Appl. Phys. Lett. , vol.75 , pp. 4001
- Klein, T.M.¹ Niu, D.² Epling, W.S.³ Li, W.⁴ Maher, D.M.⁵ Hobbs, C.C.⁶ Hedge, R.I.⁷ Baumvol, I.J.R.⁸ Parsons, G.N.⁹

15
- 17644366437
- Electrical properties of amorphous aluminum oxide thin films
- DOI 10.1016/j.actamat.2005.02.027, PII S1359645405001072
- P. Katiyar, C. Jin, and R. J. Narayan, Acta Mater. 1359-6454 53, 2617 (2005). 10.1016/j.actamat.2005.02.027 (Pubitemid 40556693)
- (2005) Acta Materialia , vol.53 , Issue.9 , pp. 2617-2622
- Katiyar, P.¹ Jin, C.² Narayan, R.J.³

16
- 0036902483
- 0021-8979, 10.1063/1.1515951
- J. B. Kim, D. R. Kwon, K. Chakrabarti, C. Lee, and K. Y. Oh, J. Appl. Phys. 0021-8979 92, 6739 (2002). 10.1063/1.1515951
- (2002) J. Appl. Phys. , vol.92 , pp. 6739
- Kim, J.B.¹ Kwon, D.R.² Chakrabarti, K.³ Lee, C.⁴ Oh, K.Y.⁵

17
- 0032489769
- Optical and electrical properties of aluminum oxide films deposited by spray pyrolysis
- DOI 10.1063/1.121156, PII S0003695198035141
- M. Aguilar-Frutis, M. Garcia, and C. Falcony, Appl. Phys. Lett. 0003-6951 72, 1700 (1998). 10.1063/1.121156 (Pubitemid 128671433)
- (1998) Applied Physics Letters , vol.72 , Issue.14 , pp. 1700-1702
- Aguilar-Frutis, M.¹ Garcia, M.² Falcony, C.³

18
- 44649107135
- 0040-6090, 10.1016/j.tsf.2007.12.151
- S. Sellner, A. Gerlach, S. Kowarik, F. Schreiber, H. Dosch, S. Meyer, J. Pflaum, and G. Ulbricht, Thin Solid Films 0040-6090 516, 6377 (2008). 10.1016/j.tsf.2007.12.151
- (2008) Thin Solid Films , vol.516 , pp. 6377
- Sellner, S.¹ Gerlach, A.² Kowarik, S.³ Schreiber, F.⁴ Dosch, H.⁵ Meyer, S.⁶ Pflaum, J.⁷ Ulbricht, G.⁸

19
- 0033748557
- 0040-6090, 10.1016/S0040-6090(00)00864-6
- A. Ortiz, J. C. Alonso, V. Pankov, A. Huanosta, and E. Andrade, Thin Solid Films 0040-6090 368, 74 (2000). 10.1016/S0040-6090(00)00864-6
- (2000) Thin Solid Films , vol.368 , pp. 74
- Ortiz, A.¹ Alonso, J.C.² Pankov, V.³ Huanosta, A.⁴ Andrade, E.⁵

20
- 0000340555
- 10.1063/1.102420
- H. Fukimoto, T. Imura, and Y. Osaka, Appl. Phys. Lett. 55, 360 (1989). 10.1063/1.102420
- (1989) Appl. Phys. Lett. , vol.55 , pp. 360
- Fukimoto, H.¹ Imura, T.² Osaka, Y.³

21
- 0027589569
- 0022-0248, 10.1016/0022-0248(93)90836-L
- J. C. Vyas, G. P. Kothiyal, K. P. Muthe, D. P. Gandhi, A. K. Debnath, S. C. Sabharwal, and M. K. Gupta, J. Cryst. Growth 0022-0248 130, 59 (1993). 10.1016/0022-0248(93)90836-L
- (1993) J. Cryst. Growth , vol.130 , pp. 59
- Vyas, J.C.¹ Kothiyal, G.P.² Muthe, K.P.³ Gandhi, D.P.⁴ Debnath, A.K.⁵ Sabharwal, S.C.⁶ Gupta, M.K.⁷

22
- 0032339299
- Structural, optical and electrical characteristics of yttrium oxide films deposited by laser ablation
- DOI 10.1116/1.581538
- J. J. Araiza, M. Cardenas, C. Falcony, V. M. Mendez-Garcia, M. Lopez, and G. Contreras-Puente, J. Vac. Sci. Technol. A 0734-2101 16, 3305 (1998). 10.1116/1.581538 (Pubitemid 128161034)
- (1998) Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films , vol.16 , Issue.6 , pp. 3305-3310
- Araiza, J.J.¹ Cardenas, M.² Falcony, C.³ Mendez-Garcia, V.H.⁴ Lopez, M.⁵ Contreras-Puente, G.⁶

23
- 0008006367
- 0734-2101, 10.1116/1.578515
- W. J. Varhue, M. Massimo, J. M. Carrulli, V. Baranauskas, E. Adams, and E. Broitman, J. Vac. Sci. Technol. A 0734-2101 11, 1870 (1993). 10.1116/1.578515
- (1993) J. Vac. Sci. Technol. A , vol.11 , pp. 1870
- Varhue, W.J.¹ Massimo, M.² Carrulli, J.M.³ Baranauskas, V.⁴ Adams, E.⁵ Broitman, E.⁶

24
- 3242672381
- 0897-4756, 10.1021/cm040145v
- J. Niinistö, M. Putkonen, and L. Niinistro, Chem. Mater. 0897-4756 16, 2953 (2004). 10.1021/cm040145v
- (2004) Chem. Mater. , vol.16 , pp. 2953
- Niinistö, J.¹ Putkonen, M.² Niinistro, L.³

25
- 70349667470
- 0003-6951, 10.1063/1.3238466
- G. Adamopoulos, A. Bashir, P. H. Wöbkenberg, D. D. C. Bradley, and T. D. Anthopoulos, Appl. Phys. Lett. 0003-6951 95, 133507 (2009). 10.1063/1.3238466
- (2009) Appl. Phys. Lett. , vol.95 , pp. 133507
- Adamopoulos, G.¹ Bashir, A.² Wöbkenberg, P.H.³ Bradley, D.D.C.⁴ Anthopoulos, T.D.⁵

26
- 78149444851
- 0935-9648, 10.1002/adma.201001444
- G. Adamopoulos, A. Bashir, S. Thomas, W. P. Gillin, S. Georgakopoulos, M. Shkunov, M. A. Baklar, N. Stingelin-Stutzmann, R. C. Maher, L. F. Cohen, D. D. C. Bradley, and T. D. Anthopoulos, Adv. Mater. (Weinheim, Ger.) 0935-9648 22, 4764 (2010). 10.1002/adma.201001444
- (2010) Adv. Mater. (Weinheim, Ger.) , vol.22 , pp. 4764
- Adamopoulos, G.¹ Bashir, A.² Thomas, S.³ Gillin, W.P.⁴ Georgakopoulos, S.⁵ Shkunov, M.⁶ Baklar, M.A.⁷ Stingelin-Stutzmann, N.⁸ Maher, R.C.⁹ Cohen, L.F.¹⁰ Bradley, D.D.C.¹¹ Anthopoulos, T.D.¹²

27
- 0035948160
- 0003-6951, 10.1063/1.1380403
- I. Costina and R. Franchy, Appl. Phys. Lett. 0003-6951 78, 4139 (2001). 10.1063/1.1380403
- (2001) Appl. Phys. Lett. , vol.78 , pp. 4139
- Costina, I.¹ Franchy, R.²

28
- 77955606977
- 0031-8965, 10.1002/pssa.200983756
- S. J. Wang, T. I. Wong, Q. Chen, M. Yang, L. M. Wong, J. W. Chai, Z. Zhang, J. S. Pan, and Y. P. Feng, Phys. Status Solidi A 0031-8965 207, 1731 (2010). 10.1002/pssa.200983756
- (2010) Phys. Status Solidi A , vol.207 , pp. 1731
- Wang, S.J.¹ Wong, T.I.² Chen, Q.³ Yang, M.⁴ Wong, L.M.⁵ Chai, J.W.⁶ Zhang, Z.⁷ Pan, J.S.⁸ Feng, Y.P.⁹

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