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Volumn 75, Issue 25, 1999, Pages 4001-4003
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Evidence of aluminum silicate formation during chemical vapor deposition of amorphous Al2O3 thin films on Si(100)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000081968
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.125519 Document Type: Article |
Times cited : (212)
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References (17)
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