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Volumn 75, Issue 25, 1999, Pages 4001-4003

Evidence of aluminum silicate formation during chemical vapor deposition of amorphous Al2O3 thin films on Si(100)

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Indexed keywords


EID: 0000081968     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125519     Document Type: Article
Times cited : (212)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.