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Volumn 27, Issue 7, 2011, Pages 3436-3441

Preparation and characterization of an ordered 1-dodecanethiol monolayer on bare Si(111) surface

Author keywords

[No Author keywords available]

Indexed keywords

1-DODECANETHIOL; ALKYL CHAIN; HIGH RESOLUTION; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; SI (1 1 1); SI-S BONDS; SUBSTRATE SURFACE; TILT ANGLE; WATER CONTACT ANGLE MEASUREMENT;

EID: 79953254235     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la103585t     Document Type: Article
Times cited : (27)

References (48)
  • 8
    • 0345979435 scopus 로고    scopus 로고
    • Ulman, A. Chem. Rev. 1996, 96, 1533-1554
    • (1996) Chem. Rev. , vol.96 , pp. 1533-1554
    • Ulman, A.1
  • 45
    • 79953244369 scopus 로고    scopus 로고
    • Although this assumption is definitely questionable, the Si-S bond angle scarcely affects the SAM thickness; we therefore estimated the monolayer thickness with the Si-S bond perpendicular to the Si surface to simplify the calculation
    • Although this assumption is definitely questionable, the Si-S bond angle scarcely affects the SAM thickness; we therefore estimated the monolayer thickness with the Si-S bond perpendicular to the Si surface to simplify the calculation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.