Molecule-induced interface states dominate charge transport in Si-alkyl-metal junctions

Journal of Physics Condensed Matter

Volumn 20, Issue 37, 2008, Pages

  Yu, Lam H ^a   Gergel Hackett, Nadine ^a   Zangmeister, Christopher D ^a   Hacker, Christina A ^a   Richter, Curt A ^a   Kushmerick, James G ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54749121218     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/20/37/374114     Document Type: Article

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