Electrical and optical characteristics of Au/PbS/n-6H-SiC structures prepared by electrodeposition of PbS thin film on n-type 6H-SiC substrate

Journal of Alloys and Compounds

Volumn 509, Issue 6, 2011, Pages 3155-3159

  Gulen Y ^a   Alanyaliolu, M ^a   Ejderha, K ^b   Nuholu, C ^a   Turut, A ^a  

^a ATATÜRK UNIVERSITY   (Turkey)

^b BINGOL UNIVERSITY   (Turkey)

Author keywords

PbS; Schottky barrier modification; Silicon carbide; XRD

Indexed keywords

DIFFRACTION PROFILES; ELECTRODEPOSITION METHODS; FORWARD BIAS; INTERFACE CHARGE; INTERFACE LAYER; INTERFACE STATE; LEAD SULFIDE; OPTICAL ABSORPTION SPECTRUM; OPTICAL CHARACTERISTICS; OPTICAL ENERGY BAND GAP; PBS; SCHOTTKY BARRIER HEIGHTS; SCHOTTKY BARRIER MODIFICATION; SEMICONDUCTOR CONTACTS; SIC SCHOTTKY DIODE; SIC SUBSTRATES; SPACE CHARGE REGIONS; XRD;

CRYSTAL STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRODEPOSITION; FILM PREPARATION; LIGHT ABSORPTION; OPTICAL MATERIALS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR DIODES; SEMICONDUCTOR METAL BOUNDARIES; SILICON CARBIDE; THIN FILMS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 78651349411     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.12.028     Document Type: Article

References (50)

1. H.J. Im, Y. Ding, J.P. Pelz, and W.J. Choyke Phys. Rev. B 64 7 2001 075310
2. M.O. Aboelfotoh, C. Fröjdh, and C.S. Petersson Phys. Rev. B 67 2003 075312
3. S. Duman, S. Doan, B. Gurbulak, and A. Turut Appl. Phys. A 91 2008 337
4. H. Mazari, Z. Benamara, K. Ameura, N. Benseddik, O. Bonnaud, R. Olier, and B. Gruzza Mater. Chem. Phys. 118 2009 1
5. V. Janardhanam, L.-Ki. Hoon, K.H. Shim, H.B. Hong, S.H. Lee, K.S. Ahn, and C.J. Choi J. Alloys Compd. 504 2010 146
6. A.J. Mathai, and K.D. Patel Cryst. Res. Technol. 45 2010 717
7. A.J. Mathai, K.D. Patel, and R. Srivastava Thin Solid Films 518 2010 4417
8. Ö. Gullu, T. Kilicoglu, and A. Turut J. Phys. Chem. Solid 71 2010 351
9. A. Shakoor, T.Z. Rizvi, M. Sulaiman, M. Nasir, and M. Ishtiaq J. Mater. Sci. Mater. Electron. 21 6 2010 603
10. Ö. Güllü, and A. Türüt J. Appl. Phys. 106 2009 103717
11. S. Aydogan, K. Cinar, H. Asil, C. Coskun, and A. Turut J. Alloys Compd. 476 2009 913
12. A. Takshi, M. Mohammadi, and J.D. Madden Solid State Electron. 52 2008 1717
13. M.E. Aydin, F. Yakuphanoglu, and T. Kiliolu Synth. Metals 157 2007 1080
14. S. Mangal, S. Adhikari, and P. Banerji Appl. Phys. Lett. 94 2009 223509
15. Ö. Gullu, S. Asubay, M. Biber, T. Kilicoglu, and A. Turut Eur. Phys. J. Appl. Phys. 50 2010 10401
16. M. Saleem, M.H. Sayyad, Z. Ahmad, K.S. Karimov, and M. Shah AIP Conference Proceedings Curr. Issues Phys. Malaysia 1017 2008 84
17. A.K. Singh, A.D.D. Dwivedi, P. Chakrabarti, and R. Prakash J. Appl. Phys. 105 2009 114506
18. F. Yakuphanoglu Synth. Metals 160 2010 1551
19. F. Yakuphanoglu, S. Ilican, M. Caglar, and Y. Caglar Superlatt. Microstruct. 47 2010 732
20. K. Akkilic, and F. Yakuphanoglu Microelectron. Eng. 85 2008 1826
21. Ö. Gullu, S. Asubay, S. Aydogan, and A. Turut Physica E 42 2010 1411
22. Ö. Vural, Y. Safak, S. Altindal, and A. Turut Curr. Appl. Phys. 10 2010 761
23. I.Y. Erdogan, and O. Gulu Appl. Surf. Sci. 256 2010 4185
24. C. Luo Conf. Inf.: 17th ASME Conf. Inf. Storage and Process. Syst. Santa Clara Univ, Santa Clara, CA, June 18-19 2007 (Source: Microsyst. Technol. Micro Nanosyst. Inf. Storage Process. Syst. 15 (10-11) (2009) 1605)
25. A.R.V. Roberts, and D.A. Evans Appl. Phys. Lett. 86 2005 072105
26. M. Alanyalioglu, F. Bayrakceken, and Ü. Demir Electrochim. Acta 54 2009 6554
27. I. Kabalci, G. Ozen, M.L. Ovecoglu, and A. Sennaroglu J. Alloys Compd. 419 2006 294
28. F. Yakuphanoglu, B.F. Senkal, and A. Sara J. Electron. Mater. 37 2008 930
29. A.K. Singh, R. Prakash, A.D.D. Dwivedi, and P. Chakrabarti IEEE Electron Device Lett. 29 2008 571
30. A. Gichuhi, B.E. Boone, and C. Shannon J. Electroanal. Chem. 522 2002 21
31. T. Torimoto, S. Nagakubo, M. Nishizawa, and H. Yoneyama Langmuir 14 1998 7077
32. I.Y. Erdogan, and U. Demir J. Electroanal. Chem. 633 2009 253
33. T. Oznuluer, I.Y. Erdogan, and U. Demir Langmuir 22 2006 4415
34. T. Oznuluer, I. Erdogan, I. Sisman, and U. Demir Chem. Mater. 17 2005 935
35. A.P. Gaiduk, P.I. Gaiduk, and A.N. Larsen Thin Solid Films 516 12 2008 3791
36. V. Stancu, M. Buda, L. Pintilie, I. Pintilie, T. Botila, and G. Iordache Thin Solid Films 516 2008 4301
37. P.A. Swarthmore, Joint Committee on Powder Diffraction Standards, Card no. 4-784.
38. J. Puiso, S. Tamulevicius, G. Laukaitis, S. Lindroos, M. Leskela, and V. Snitka Thin Solid Films 403-404 2002 457
39. N. Choudhury, and B.K. Sarma Bull. Mater. Sci. 32 2009 43
40. E.H. Rhoderick, and R.H. Williams Metal-Semiconductor Contacts 1988 Clarendon Oxford
41. W. Mönch Semiconductor Surfaces and Interfaces 3rd ed. 2001 Springer Berlin p. 389, 421, 485
42. D.A. Neamen Semiconductors Physics and Devices 1992 R.R. Donnelley & Sons Company Berlin
43. A. Watt, H.R. Dunlop, and P. Meredith Mater. Lett. 59 2005 3033
44. K.K. Nanda, and S.N. Sahu Appl. Phys. Lett. 79 17 2001 2743
45. M. Biber, and A. Türüt J. Electron. Mater. 31 12 2002 1362
46. Z. Chen, W. Kim, A. Salvador, S.N. Mohammed, O. Aktas, and H. Morko J. Appl. Phys. 78 1995 3920
47. A.A.M. Farag, A. Ashery, E.M.A. Ahmed, and M.A. Salem J. Alloys Compd. 495 2010 116
48. S.R. Forrest, and F.F. So J. Appl. Phys. 64 1988 399
49. M. akar, A. Türüt, and Y. Onganer J. Matter Sci.: Mater. Electron. 126 2002 213
50. A. Bolognesi, A. Di Carlo, P. Lugli, T. Kampen, and D.R.T. Zahn J. Phys.: Condens. Matter 15 2003 S2719