Structural characterization of lead sulfide thin films by means of X-ray line profile analysis

Bulletin of Materials Science

Volumn 32, Issue 1, 2009, Pages 43-47

  Choudhury, N ^a   Sarma, B K ^a  

^a GAUHATI UNIVERSITY   (India)

Author keywords

Average internal stress; Microstrain; PbS thin films; X ray diffraction

Indexed keywords

AVERAGE INTERNAL STRESS; LATTICE PARAMETERS; LEAD SULFIDES; LEAD SULPHIDES; MICROSTRAIN; PBS THIN FILMS; STRUCTURAL CHARACTERIZATIONS; X-RAY DIFFRACTION PATTERNS; X-RAY LINE PROFILE ANALYSIS;

CRYSTALLITE SIZE; DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; THIN FILMS; X RAY DIFFRACTION; X RAYS;

X RAY DIFFRACTION ANALYSIS;

EID: 65249150164     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12034-009-0007-y     Document Type: Article

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