Resonance Raman scattering and scanning tunneling spectroscopy of CdS thin films grown by electrochemical atomic layer epitaxy - Thickness dependent phonon and electronic properties

Journal of Electroanalytical Chemistry

Volumn 522, Issue 1, 2002, Pages 21-25

  Gichuhi, Anthony ^a   Boone, B Edward ^a   Shannon, Curtis ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

Electrodeposition; Film growth; Raman spectroscopy; Scanning tunneling microscopy

Indexed keywords

CADMIUM SULFIDE; ELECTRODEPOSITION; ENERGY GAP; EXCITONS; FILM GROWTH; LIGHT POLARIZATION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MOLECULAR BEAM EPITAXY; MONOLAYERS; PHONONS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY;

ELECTROCHEMICAL ATOMIC LAYER EPITAXY (EC-ALE);

ULTRATHIN FILMS;

EID: 0037155330     PISSN: 00220728     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(01)00713-6     Document Type: Article

References (17)