Approach to the physical origin of breakdown in silicon solar cells by optical spectroscopy

Journal of Applied Physics

Volumn 108, Issue 12, 2010, Pages

  Gundel, Paul ^a   Kwapil, Wolfram ^a   Schubert, Martin C ^a   Seifert, Holger ^a   Warta, Wilhelm ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAP ENERGY; BREAKDOWN SITES; ELECTRICAL BREAKDOWN; ELECTROLUMINESCENCE SPECTRA; HIGH-RESOLUTION SPECTROSCOPY; MICRO RAMAN SPECTROSCOPY; MICROPHOTOLUMINESCENCE SPECTROSCOPY; ONSET VOLTAGES; OPTICAL SPECTROSCOPY; PREBREAKDOWN; RED SHIFT; REVERSE BIAS; REVERSE CURRENTS; REVERSE VOLTAGES;

ELECTROLUMINESCENCE; RAMAN SPECTROSCOPY; SOLAR CELLS; SPECTROSCOPIC ANALYSIS;

SILICON SOLAR CELLS;

EID: 78650895915     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3517086     Document Type: Article

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