Reverse biased electroluminescence spectroscopy of crystalline silicon solar cells with high spatial resolution

Physica Status Solidi (A) Applications and Materials Science

Volumn 207, Issue 11, 2010, Pages 2597-2600

  Schneemann, Matthias ^a   Helbig, Anke ^b   Kirchartz, Thomas ^a   Carius, Reinhard ^a   Rau, Uwe ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

breakdown; electroluminescence; hot spots; silicon; solar cells

Indexed keywords

APPLIED VOLTAGES; BAND GAP ENERGY; BREAKDOWN; BREAKDOWN SITES; CLOSE DISTANCE; CRYSTALLINE SILICON SOLAR CELLS; ELECTROLUMINESCENCE SPECTRA; ELECTROLUMINESCENCE SPECTROSCOPY; EMISSION INTENSITY; HIGH SPATIAL RESOLUTION; HOT SPOT; ILLUMINATION INTENSITY; LOCAL EMISSIONS; MICROSCOPIC MEASUREMENT; MICROSCOPIC SCALE; ONSET VOLTAGES; ORDER OF MAGNITUDE; REVERSE BIAS; SINGLE SITES; VISIBLE LIGHT;

CRYSTALLINE MATERIALS; ELECTROLUMINESCENCE; SILICON SOLAR CELLS; SOLAR CELLS; SPECTROMETERS;

LIGHT;

EID: 78349292621     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201026309     Document Type: Article

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