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Volumn 97, Issue 25, 2010, Pages

The atomic structure and polarization of strained SrTiO3/Si

(11) Kumah, D P a Reiner, J W a Segal, Y a Kolpak, A M a Zhang, Z b Su, D c Zhu, Y c Sawicki, M S d Broadbridge, C C d Ahn, C H a Walker, F J a

a YALE UNIVERSITY (United States)

b ARGONNE NATIONAL LABORATORY (United States)

c BROOKHAVEN NATIONAL LABORATORY (United States)

d SOUTHERN CONNECTICUT STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STRUCTURE; CHEMICAL INTERACTIONS; DIFFERENT BOUNDARY CONDITION; FERROELECTRIC POLARIZATION; INTERFACE STRUCTURES; SRTIO; SUB-LATTICES; SYNCHROTRON X RAY DIFFRACTION;

CRYSTAL ATOMIC STRUCTURE; POLARIZATION; SILICON; STRONTIUM ALLOYS; THIN FILM DEVICES; X RAY DIFFRACTION;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 78650739173 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3529460 Document Type: Article

Times cited : (28)

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