Imaging the phase separation in atomically thin buried SrTiO3 layers by electron channeling

Physical Review Letters

Volumn 100, Issue 3, 2008, Pages

  Kourkoutis, L Fitting ^a   Hellberg, C Stephen ^b   Vaithyanathan, V ^c   Li, Hao ^d   Parker, M K ^a   Andersen, K E ^b   Schlom, D G ^c   Muller, D A ^a  

^a School of Operations Research and Industrial Engineering   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

^d MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TUNNELING; EPITAXIAL GROWTH; OXIDE FILMS; PHASE SEPARATION; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS;

ELECTRON CHANNELING; EPITAXIAL ISLANDS;

THIN FILMS;

EID: 38549099070     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.100.036101     Document Type: Article

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