Controlling bistability in tapping-mode atomic force microscopy using dual-frequency excitation

Applied Physics Letters

Volumn 91, Issue 9, 2007, Pages

  Thota, Phanikrishna ^a   MacLaren, Scott ^b   Dankowicz, Harry ^c  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b University of Illinois at Urbana Champaign

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; FEEDBACK CONTROL; PHASE TRANSITIONS;

DUAL-FREQUENCY EXCITATION; DYNAMIC FORCE CURVES; FREQUENCY EXCITATION; SECONDARY EXCITATION;

SURFACE ANALYSIS;

EID: 34548400329     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2775031     Document Type: Article

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