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Journal of Vacuum Science and Technology B

Volumn 28, Issue 3, 2010, Pages

Numerical analysis of dynamic force spectroscopy using a dual-oscillator sensor

(2) Solares, Santiago D a Hölscher, Hendrik b

a UNIVERSITY OF MARYLAND (United States)

b KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DATA HANDLING; SPECTRUM ANALYSIS;

DATA PROCESSING SOFTWARE; DYNAMIC FORCE SPECTROSCOPY; FORCE SPECTROSCOPY; FOURIER DATA; IMAGING ARTIFACTS; IMAGING SPECTROSCOPY; MICROSCOPY IMAGING; OSCILLATOR SIMULATION; SPECTRAL ANALYSIS METHOD; TAPPING-MODE ATOMIC FORCE MICROSCOPY;

NUMERICAL METHODS;

EID: 77952977267 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3305338 Document Type: Conference Paper

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.