SCOPUS 정보 검색 플랫폼

Journal of Non-Crystalline Solids

Volumn 356, Issue 41-42, 2010, Pages 2192-2197

Optical characterization of SnO2:F films by spectroscopic ellipsometry

(5) Atay, F a Bilgin, V b Akyuz, I a Ketenci, E a Kose, S a

a ESKISEHIR OSMANGAZI UNIVERSITY (Turkey)

b ÇANAKKALE ONSEKIZ MART UNIVERSITY (Turkey)

Author keywords

SnO2:F films; Spectroscopic ellipsometry (SE); Ultrasonic spray pyrolysis; UV

Indexed keywords

BAND GAPS; BAND TAILING; ELLIPSOMETRIC ANGLES; NON DESTRUCTIVE; NON-CONTACT; OPTICAL ANALYSIS; OPTICAL CHARACTERIZATION; OPTICAL METHODS; OPTICAL TECHNIQUE; ROOM TEMPERATURE; SNO2:F FILMS; SOURCE POINTS; TRANSMITTANCE SPECTRA; ULTRASONIC SPRAY PYROLYSIS; ULTRASONIC SPRAY PYROLYSIS TECHNIQUE; UV;

CHARACTERIZATION; OPTICAL CONSTANTS; OPTICAL ENGINEERING; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; ULTRASONIC TESTING; ULTRASONICS; ULTRAVIOLET SPECTROSCOPY;

SPRAY PYROLYSIS;

EID: 77957154300 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2010.07.007 Document Type: Article

Times cited : (33)

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