Dielectric function of germanium nanocrystals between 0.6 and 6.5 eV by spectroscopic ellipsometry

Journal of Physics and Chemistry of Solids

Volumn 67, Issue 5-6, 2006, Pages 1291-1294

  Mansour, M ^a   En Naciri, A ^a   Johann, L ^a   Duguay, S ^b   Grob, J J ^b   Stchakovsky, M ^c   Eypert, C ^c  

^a UNIVERSITÉ DE LORRAINE   (France)

^b Faculté de Médecine   (France)

^c Horiba Jobin Yvon   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELLIPSOMETRY; GERMANIUM COMPOUNDS; QUANTUM THEORY; SILICON; SPECTROSCOPIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

DIELECTRIC FUNCTION; GERMANIUM NANOCRYSTALS; INVERSION METHOD; SPECTROSCOPIC ELLIPSOMETRY (SE);

NANOSTRUCTURED MATERIALS;

EID: 33744921672     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2006.01.059     Document Type: Article

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