Spectroscopic ellipsometry characterization of Er3+-doped titania thin films prepared by the sol-gel method

Optik (Jena)

Volumn 112, Issue 7, 2001, Pages 316-320

  Palomino Merino, R ^a   Mendoza Galvan A ^b   Martinez G ^a   Castano V ^e   Rodriguez R ^c,d  

^a BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

^b DEPARTAMENTO DE FÍSICA   (Mexico)

^c CENTRO DE FÍSICA APLICADA Y TECNOLOGÍA AVANZADA   (Mexico)

^d DEPARTAMENTO DE QUÍMICA   (Mexico)

^e NONE

Author keywords

Ellipsometry; Film characterization; Sol gel method; Thin films

Indexed keywords

ERBIUM; REFRACTIVE INDEX; THICKNESS MEASUREMENT; THIN FILMS;

SOL-GEL METHOD; SPECTROSCOPIC ELLIPSOMETRY; TITANIA THIN FILMS;

ELLIPSOMETRY;

EID: 0034830620     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1078/0030-4026-00054     Document Type: Article

References (24)

1. Chemistry of glasses
2. Sol-Gel science
3. Better ceramics through chemistry IV
4. Better ceramics through chemistry V
5. Synthesis and processing of ceramics: Scientific issues
6. Soluble silicates
7. Sol-Gel principles and applications
8. Chemistry of alkoxides precursors
9. Theory of dielectric waveguides
10. Organic films in non-linear integrated optics structures
11. Nonlinear waves guided by thin films
12. Sol-Gel optics processing and applications
13. Optical characterization of Titania thin films produced by the Sol-Gel method and doped with Co(II) a different concentrations
14. Spin coating process of sol-gel silicate film deposition: Effect of spin speed and processing temperature
15. The principles of nonlinear optics
16. Efficient SHG of IR radiation by guided waves in MNA
17. Nonlinear integrated optics
18. Theory of dielectric waveguides
19. Nonlinear integrated optics
20. Waveguides and fibers for nonlinear optics
21. Crystallization of nanosized titania particles prepared by sol-gel process
22. High precision scanning ellipsometer
23. Optical dispersion relations for amorphous semiconductors and amorphous dielectrics
24. Data analysis for spectroscopic ellipsometry