Spectroscopic ellipsometry characterization of TiO2 thin films prepared by the sol-gel method

Ceramics International

Volumn 34, Issue 4, 2008, Pages 1039-1042

  Jiang, Hai Qing ^a   Wei, Quan ^a   Cao, Quan Xi ^a   Yao, Xi ^b  

^a XIDIAN UNIVERSITY   (China)

^b BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

A. Films; C. Optical properties; D. TiO2; Sol gel processes

Indexed keywords

OPTICAL CONSTANTS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE MORPHOLOGY; TITANIUM OXIDES;

CROSS SECTIONS; ELLIPSOMETRIC ANGLES; EXTINCTION COEFFICIENTS; FIELD EMISSION SCANNING ELECTRON MICROSCOPY;

THIN FILMS;

EID: 42649103316     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2007.09.101     Document Type: Article

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