Spectroscopic ellipsometry for characterization of thin films of polymer blends

Macromolecular Symposia

Volumn 230, Issue , 2005, Pages 26-32

  Hinrichs, K ^a   Gensch, M ^a   Nikonenko, N ^b   Pionteck, J ^c   Eichhorn, K J ^c  

^a ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

^b B I STEPANOV INSTITUTE OF PHYSICS   (Belarus)

^c LEIBNIZ INSTITUTE OF POLYMER RESEARCH DRESDEN   (Germany)

Author keywords

Blends; Films; Infrared spectroscopy; Mixing; Simulations

Indexed keywords

ANNEALING; CHARACTERIZATION; COMPUTER SIMULATION; DIFFUSION; ELLIPSOMETRY; INTERFACES (MATERIALS); MIXING; MORPHOLOGY; POLYVINYL CHLORIDES; SOLUBILITY; THIN FILMS;

ELLIPSOMETRIC SPECTRA; INTERDIFFUSION; SPECTROSCOPIC ELLIPSOMETRY;

POLYMER BLENDS;

EID: 31044449358     PISSN: 10221360     EISSN: 15213900     Source Type: Journal    
DOI: 10.1002/masy.200551138     Document Type: Conference Paper

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