Generalized ellipsometry for materials characterization

Thin Solid Films

Volumn 450, Issue 1, 2004, Pages 42-50

  Jellison, G E ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Anisotropic; Polarization; Transmission

Indexed keywords

ANISOTROPY; ELECTRIC FIELD EFFECTS; ELLIPSOMETRY; LITHIUM COMPOUNDS; MATRIX ALGEBRA; PHASE SHIFT; PHOTOELASTICITY; PHOTOLUMINESCENCE; POLARIZATION; RAMAN SCATTERING; SPECTROSCOPIC ANALYSIS;

DEPOLARIZATION EFFECTS; TRANSMISSION;

THIN FILMS;

EID: 1142291780     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.148     Document Type: Conference Paper

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