Ellipsometric analysis for surface roughness and texture

Applied Optics

Volumn 27, Issue 14, 1988, Pages 2819-2831

  Nee, Soe Mie F ^a  

^a NAVAL AIR WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21544443523     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.27.002819     Document Type: Article

References (31)

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