Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 78, Issue 1, 2000, Pages 53-58

  Senthil, K ^a   Mangalaraj, D ^a   Narayandass, Sa K ^a   Adachi, Sadao ^b  

^a Thin Film Laboratory   (India)

^b GUNMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; EVAPORATION; LIGHT ABSORPTION; LIGHT TRANSMISSION; PERMITTIVITY; PHOTONS; REFRACTIVE INDEX; SEMICONDUCTING CADMIUM COMPOUNDS; THIN FILMS; VACUUM APPLICATIONS;

CADMIUM SULFIDE; OPTICAL CONSTANTS; SPECTROSCOPIC ELLIPSOMETRY; VACUUM EVAPORATION;

SEMICONDUCTING FILMS;

EID: 0034296535     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(00)00510-9     Document Type: Article

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