Process reliability based trojans through NBTI and HCI effects

2010 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2010

Volumn , Issue , 2010, Pages 215-222

  Shiyanovskii, Y ^a   Wolff, F ^a   Rajendran, A ^a   Papachristou, C ^a   Weyer, D ^b   Clay, W ^b  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

^b ROCKWELL AUTOMATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATASTROPHIC CONSEQUENCES; CMOS TRANSISTORS; DETECTION TECHNIQUE; FABRICATION PROCESS; HARDWARE/SOFTWARE; HOT CARRIER INJECTION; MANUFACTURING PROCESS; NEGATIVE BIAS TEMPERATURE INSTABILITY; PROCESS ALTERATIONS; PROCESS RELIABILITY; TROJANS;

CHEMICAL DETECTION; DAMAGE DETECTION; INDUSTRIAL ENGINEERING; INTEGRATED CIRCUITS; MANUFACTURE; PRODUCTION ENGINEERING; RELIABILITY;

HOT CARRIERS;

EID: 77956948329     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AHS.2010.5546257     Document Type: Conference Paper

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