Reliability- and process-variation aware design of VLSI circuits

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2007, Pages 17-25

  Alam, M ^a   Kang, K ^a   Paul, B C ^a   Roy, K ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RELIABLE CIRCUITS; UNRELIABLE COMPONENTS;

INTEGRATED CIRCUITS; RELIABILITY;

VLSI CIRCUITS;

EID: 39749185484     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPFA.2007.4378050     Document Type: Conference Paper

References (72)