A new approach to evaluation of hot-carrier lifetime of ring oscillator (RO)

IEEE Transactions on Electron Devices

Volumn 49, Issue 9, 2002, Pages 1672-1674

  Zhang, Jiong ^a,b   Chu, Shao Fu Sanford ^a  

^a CHARTERED SEMICONDUCTOR MANUFACTURING LTD   (Singapore)

^b Wireless Communications Division   (United States)

Author keywords

CMOS; Hot carrier; Reliability

Indexed keywords

CMOS INTEGRATED CIRCUITS; EVALUATION; FREQUENCIES; OSCILLATORS (ELECTRONIC); RELIABILITY; SEMICONDUCTOR DEVICE TESTING; VOLTAGE MEASUREMENT;

HOT CARRIER LIFETIME; PULSE TO PULSE VOLTAGE; RING OSCILLATORS;

HOT CARRIERS;

EID: 0036712556     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2002.802660     Document Type: Article

References (13)

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