Towards trojan-free trusted ICs: Problem analysis and detection scheme

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2008, Pages 1362-1365

  Wolff, Francis ^a   Papachristou, Chris ^a   Bhunia, Swarup ^a   Chakraborty, Rajat S ^a  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRIAL ENGINEERING; INTEGRATED CIRCUITS; MILITARY APPLICATIONS; MILITARY COMMUNICATIONS; MILITARY OPERATIONS; TESTING; VECTORS;

AND DETECTION; CHIP MANUFACTURING; CRITICAL APPLICATIONS; FREQUENCY ANALYSIS; MAIN CIRCUIT; PROBLEM ANALYSIS; PROBLEM BASED; TEST VECTORS; TROJAN HORSES;

ERROR ANALYSIS;

EID: 49749105556     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484928     Document Type: Conference Paper

References (7)

1. D. Agrawal and et al. Trojan detection using ic fingerprinting. IEEE Symp. On Security and Privacy, pages 296-310, 2007.
2. D. Hely, F. Bancel, M. Flottes, and B. Rouzeyre. Secure scan techniques: a comparison. In 12th IEEE International On-Line Testing Symposium (IOLTS), pages 119-124, 2006.
3. J. Kumagai. Chip detectives. IEEE Spectrum, 37(11):43-49, Nov. 2000.
4. S. Paul, R. S. Chakraborty, and S. Bhunia. Vim-scan: A low overhead scan design approach for protection of secret key in scan-based secure chips. VLSI Test Symposium (VTS), 2007.
5. S. Ravi, A. Raghunathan, and S. Chakradhar. Tamper resistance mechanisms for secure embedded systems. 17th International Conference on VLSI Design, 94(2):605 - 611, Feb. 2004.
6. G. E. Suh and S. Devadas. Physical unclonable functions for device authentication and secret key generation. Proceedings of the Design Automation Conference (DAC), pages 9-14, 2007.
7. K. Tiri and I. Verbauwhede. A digital design flow for secure integrated circuits. IEEE TCAD, pages 1197-1208, 2006.