Potential thermal security risks

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 2005, Pages 229-234

  Dadvar, Puyan ^a   Skadron, Kevin ^a  

^a University of Virginia   (United States)

Author keywords

Cooling; DVS; Overclocking; Overheating; Power; Security; Temperature; Thermal; Throttling; Virus, failsafe

Indexed keywords

DVS; OVERCLOCKING; OVERHEATING; POWER; SECURITY; THERMAL; THROTTLING; VIRUS, FAILSAFE;

COMPUTER SOFTWARE; COMPUTER VIRUSES; MICROPROCESSOR CHIPS; RISK ASSESSMENT; THERMOANALYSIS;

SECURITY SYSTEMS;

EID: 28144441083     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/STHERM.2005.1412184     Document Type: Conference Paper

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