X-ray probes for in Situ studies of interfaces

MRS Bulletin

Volumn 35, Issue 7, 2010, Pages 504-513

  Fong, D D ^a   Lucas, C A ^a   Richard, M I ^a   Toney, M F ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; INTERFACES (MATERIALS); LIGHT SOURCES; MICROELECTRONICS; PROBES; SYNCHROTRON RADIATION; THIN FILMS; X RAY SCATTERING;

ATOMIC-SCALE RESOLUTION; ELECTROCHEMICAL PROCESS; INTERFACE FUNCTIONS; INTERFACIAL STRUCTURES; LIQUID ENVIRONMENT; REAL TIME MONITORING; SYNCHROTRON LIGHT SOURCE; SYNCHROTRON X-RAY SCATTERING;

PHASE INTERFACES;

EID: 77954965726     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2010.599     Document Type: Article

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