In situ x-ray diffraction study of the initial dealloying and passivation of Cu3 Au (111) during anodic dissolution

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 23, 2008, Pages

  Renner, F U ^a,b,d   Stierle, A ^b   Dosch, H ^b   Kolb, D M ^c   Lee, T L ^a   Zegenhagen, J ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^c UNIVERSITY OF ULM   (Germany)

^d MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 46049092047     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.235433     Document Type: Article

References (59)

1. G. H. Koch, M. P. H. Brongers, N. G. Thompson, Y. P. Virmani, and J. H. Payer, FHWA-RD-01-156, Federal Highway Administration, U.S. Department of Transportation, Washington, D.C., March 2002.
2. G. Tammann, Z. Anorg. Allg. Chem. ZAACAB 0044-2313 10.1002/zaac. 19191070102 107, 1 (1919).
3. L. Graf, Z. Metallkd. 46, 378 (1955). 0044-3093
4. H. Gerischer and H. Rickert, Z. Metallkd. ZEMTAE 0044-3093 46, 681 (1955).
5. L. B. Hunt, Gold Bull. (Geneva) 9, 24 (1976). 0017-1557
6. H. Lechtman, Sci. Am. 250, 38 (1984). 0036-8733
7. H. Kaiser and G. A. Eckstein, Encyclopedia of Electrochemistry (Wiley, Weinheim, 2003), Vol. 4.
8. H. W. Pickering, Corros. Sci. CRRSAA 0010-938X 10.1016/0010-938X(83) 90092-6 23, 1107 (1983).
9. E. Schofield, Trans. Inst. Met. Finish. TIMFA2 0020-2967 10.1179/002029605X17701 83, 35 (2005).
10. R. Li and K. Sieradzki, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.68.1168 68, 1168 (1992).
11. S. Parida, D. Kramer, C. A. Volkert, H. Rosner, J. Erlebacher, and J. Weissmuller, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.97.035504 97, 035504 (2006).
12. J. Rugolo, J. Erlebacher, and K. Sieradzki, Nat. Mater. NMAACR 1476-1122 10.1038/nmat1780 5, 946 (2006).
13. M. Raney, U.S. Patent 1628190 (1927).
14. Y. Ding, M. W. Chen, and J. Erlebacher, J. Am. Chem. Soc. JACSAT 0002-7863 10.1021/ja0320119 126, 6876 (2004).
15. D. V. Pugh, A. Dursun, and S. G. Corcoran, J. Mater. Res. JMREEE 0884-2914 10.1557/JMR.2003.0030 18, 216 (2003).
16. A. M. Hodge, J. Biener, L. L. Hsiung, Y. M. Wang, A. V. Hamza, and J. H. Satcher, Jr., J. Mater. Res. JMREEE 0884-2914 10.1557/JMR.2005.0081 20, 554 (2005).
17. D. Kramer, R. N. Viswanath, and J. Weissmueller, Nano Lett. NALEFD 1530-6984 10.1021/nl049927d 4, 793 (2004).
18. A. J. Forty and G. A. Rowlands, Philos. Mag. A PMAADG 0141-8610 10.1080/01418618108239399 43, 171 (1980).
19. I. C. Oppenheim, D. J. Trevor, Ch. E. D. Chidsey, P. L. Trevor, and K. Sieradzki, Science SCIEAS 0036-8075 10.1126/science.254.5032.687 254, 687 (1991).
20. S. J. Chen, F. Sanz, D. F. Ogletree, V. M. Hallmark, T. M. Devine, and M. Salmeron, Surf. Sci. SUSCAS 0039-6028 10.1016/0039-6028(93)90334-G 292, 289 (1993).
21. G. A. Eckstein, Ph.D. thesis, Universität Erlangen, 2001.
22. M. Stratmann and M. Rohwerder, Nature (London) NATUAS 0028-0836 10.1038/35068652 410, 420 (2001).
23. R. C. Newman, S. G. Corcoran, J. Erlebacher, M. J. Aziz, and K. Sieradzki, Mater. Res. Bull. MRBUAC 0025-5408 10.1016/0025-5408(89)90004-4 24, 23 (1999).
24. J. Erlebacher, M. J. Aziz, A. Karma, M. Dimitrov, and K. Sieradzki, Nature (London) NATUAS 0028-0836 10.1038/35068529 410, 450 (2001).
25. J. Erlebacher, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1784820 151, C614 (2004).
26. F. U. Renner, A. Stierle, H. Dosch, D. M. Kolb, T. L. Lee, and J. Zegenhagen, Nature (London) NATUAS 0028-0836 10.1038/nature04465 439, 707 (2006).
27. A. Stierle, A. Steinhauser, A. Rühm, F. U. Renner, R. Weigel, N. Kasper, and H. Dosch, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1819552 75, 5302 (2004).
28. G. Materlik, M. Schmäh, J. Zegenhagen, and W. Uelhoff, Ber. Bunsenges. Phys. Chem. 91, 292 (1987). 0005-9021
29. M. Fleischman and B. W. Mao, J. Electroanal. Chem. Interfacial Electrochem. JEIEBC 0022-0728 10.1016/0022-0728(87)85135-5 229, 125 (1987).
30. M. G. Samant, M. F. Toney, G. L. Borges, L. Blum, and O. R. Melroy, Surf. Sci. SUSCAS 0039-6028 10.1016/0039-6028(88)90314-7 193, L29 (1988).
31. Z. Nagy, H. You, R. M. Yonco, C A. Melendres, W. Yun, and V. A. Maroni, Electrochim. Acta ELCAAV 0013-4686 10.1016/0013-4686(91)85203-J 36, 209 (1991).
32. B. M. Ocko, J. Wang, A. Davenport, and H. Isaacs, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.65.1466 65, 1466 (1990).
33. J. Zegenhagen, A. Kazimirov, G. Scherb, D. M. Kolb, D.-M. Smilgies, and R. Feidenhans'l, Surf. Sci. SUSCAS 0039-6028 352-254, 346 (1996).
34. T. Kondo, K. Tamura, M. Takahasi, J. Mizuki, and K. Uosaki, Electrochim. Acta 47, 2075 (2002). 0013-4686
35. E. Vlieg, J. Appl. Crystallogr. JACGAR 0021-8898 10.1107/ S0021889897002537 30, 532 (1997).
36. E. Vlieg, J. Appl. Crystallogr. JACGAR 0021-8898 10.1107/ S0021889899013655 33, 401 (2000).
37. M. Pourbaix, Atlas d'Equilibres Electrochemique (Gauthier-Villars, Paris, 1963).
38. J. Erlebacher, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1784820 151, C614 (2004).
39. A. Dursun, D. V. Pugh, and S. G. Corcoran, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1848351 152, B65 (2005).
40. The lattice plane distance and reciprocal position is 133 pm and (2, 2, 0), respectively, for the Cu3 Au substrate, and 144 pm and (1.84, 1.84, 0) for an epitaxially aligned Au film.
41. The in-plane rocking width is about 10 - 20, in reciprocal space only slightly larger than the radial width. Part of the transversal width is therefore originating, in addition to a small mosaicity of the crystalline layer, from a size broadening.
42. H. Hong and R. J. Birgeneau, Z. Phys. B: Condens. Matter ZPCMDN 0722-3277 10.1007/BF01453791 77, 413 (1989).
43. I. K. Robinson and D. J. Tweet, Rep. Prog. Phys. RPPHAG 0034-4885 10.1088/0034-4885/55/5/002 55, 599 (1992).
44. X. Torrelles, J. Zegenhagen, J. Rius, T. Gloege, L. X. Cao, and W. Moritz, Surf. Sci. SUSCAS 0039-6028 10.1016/j.susc.2005.05.065 589, 184 (2005).
45. M. Aguilar, E. Anguiano, J. A. Aznárez, and J. L. Sacedón, Surf. Sci. 482-485, 935 (2001). 0039-6028
46. R. Schuster, D. Thron, M. Binetti, X. Xia, and G. Ertl, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.91.066101 91, 066101 (2003).
47. J. Jacobsen, L. P. Nielsen, F. Besenbacher, I. Stensgaard, E. Laegsgaard, T. Rasmussen, K. W. Jacobsen, and J. K. Nørskov, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.75.489 75, 489 (1995).
48. T. E. Jones, T. C. Q. Noakes, P. Bailey, and C. J. Baddeley, Surf. Sci. SUSCAS 0039-6028 10.1016/j.susc.2006.03.002 600, 2129 (2006).
49. K. Umezawa, S. Nakanishi, and W. M. Gibson, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.57.8842 57, 8842 (1998).
50. K. Umezawa, T. Ito, S. Nakanishi, and W. M. Gibson, Appl. Surf. Sci. ASUSEE 0169-4332 s fo 219, 102 (2003).
51. O. M. Magnussen, J. Scherer, B. M. Ocko, and R. J. Behm, J. Phys. Chem. B JPCBFK 1089-5647 10.1021/jp993615v 104, 1222 (2000).
52. Y. Chu, I. K. Robinson, and A. A. Gewirth, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.478495 110, 5952 (1999).
53. R. T. Tung, J. M. Gibson, and J. M. Poate, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.50.429 50, 429 (1983).
54. H. Fujitani, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.57.8801 57, 8801 (1998).
55. H. W. Pickering and C. Wagner, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2426709 114, 698 (1967).
56. F. U. Renner, A. Stierle, H. Dosch, D. M. Kolb, and J. Zegenhagen, Electrochem. Commun. ECCMF9 1388-2481 10.1016/j.elecom.2007.03.001 9, 1639 (2007).
57. D. Wolf, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.105017 58, 2081 (1991).
58. Z. Shi, S. Wu, and J. Lipkowski, Electrochim. Acta ELCAAV 0013-4686 10.1016/0013-4686(94)00244-U 40, 9 (1995), and references herein.
59. T. P. Moffat, F.-R. F. Fan, and A. J. Bard, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2085396 138, 3224 (1991).