Atomic imaging of thin films with surface x-ray diffraction: Introducing DCAF

Journal of Physics Condensed Matter

Volumn 20, Issue 44, 2008, Pages

  Bjorck M ^a   Schleputz C M ^a   Pauli, S A ^a   Martoccia, D ^a   Herger, R ^a   Willmott, P R ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DIFFRACTION; ELECTRON DENSITY MEASUREMENT; ELECTRON ENERGY LEVELS; LANTHANUM; MAGNETIC FILMS; MANGANESE COMPOUNDS; MAPS; MOLECULAR BEAM EPITAXY; STRONTIUM ALLOYS; SUBSTRATES; THICK FILMS; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION;

ATOMIC IMAGING; BULK SUBSTRATES; DIRECT METHODS; ELECTRON DENSITIES; ELECTRON DENSITY MAPS; FILM SHIFTS; HETEROEPITAXIAL; MONOLAYER FILMS; REAL DATA SETS; REAL SPACES; REPRODUCIBILITY; STRUCTURAL SOLUTIONS; STRUCTURAL UNCERTAINTIES; STRUCTURE REFINEMENTS; SUBSTRATE INTERFACES; UNIT CELL SIZES; X-RAY DIFFRACTIONS;

ELECTRONS;

EID: 56349163723     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/20/44/445006     Document Type: Article

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