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Volumn 24, Issue 1, 1999, Pages 21-25

Real-time X-ray scattering studies of surface structure during metalorganic chemical vapor deposition of GaN

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MORPHOLOGY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR GROWTH; SURFACE STRUCTURE; THIN FILMS; X RAY SCATTERING;

EID: 0032740538     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S088376940005168X     Document Type: Article
Times cited : (49)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.