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European Physical Journal: Special Topics

Volumn 167, Issue 1, 2009, Pages 3-10

Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction

(12) Richard, M I a,b Katcho, N A c Proietti, M G d Renevier, Hubert e Favre Nicolin, V a Zhong, Z f Chen, G f Stoffel, M g Schmidt, O g Renaud, G a Schulli T U a Bauer, G f

a CEA GRENOBLE (France)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c UNIVERSIDAD COMPLUTENSE DE MADRID (Spain)

d UNIVERSITY OF ZARAGOZA (Spain)

e LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE (France)

f JOHANNES KEPLER UNIVERSITY LINZ (Austria)

g IFW DRESDEN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 63749119766 PISSN: 19516355 EISSN: 19516401 Source Type: Journal
DOI: 10.1140/epjst/e2009-00929-4 Document Type: Article

Times cited : (8)

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