Image contrast in X-ray reflection interface microscopy: Comparison of data with model calculations and simulations

Journal of Synchrotron Radiation

Volumn 15, Issue 6, 2008, Pages 558-571

  Fenter, P ^a   Park, C ^a   Kohli, V ^a   Zhang, Z ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Full field imaging; Interfacial X ray scattering; Phase contrast; Pure phase object; Structure factor; Surface topography; X ray microscopy; X ray reflectivity

Indexed keywords

CONDENSERS (LIQUEFIERS); ENGINEERING GEOLOGY; EXPERIMENTS; IMAGE ENHANCEMENT; LENSES; MATHEMATICAL MODELS; MODAL ANALYSIS; MOMENTUM TRANSFER; OPTICAL INSTRUMENT LENSES; OPTICAL INSTRUMENTS; PHASE INTERFACES; PROBABILITY DENSITY FUNCTION; REFLECTION; SCATTERING; SURFACE STRUCTURE; TRANSFER FUNCTIONS; X RAY OPTICS; X RAYS;

FULL-FIELD IMAGING; INTERFACIAL X-RAY SCATTERING; PHASE CONTRAST; PURE PHASE OBJECT; STRUCTURE FACTOR; X-RAY MICROSCOPY; X-RAY REFLECTIVITY;

SURFACE TOPOGRAPHY;

ARTICLE; COMPARATIVE STUDY; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; EVALUATION; IMAGE ENHANCEMENT; METHODOLOGY; PHASE CONTRAST MICROSCOPY; RADIATION SCATTERING; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THEORETICAL MODEL; X RAY DIFFRACTION;

COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY, PHASE-CONTRAST; MODELS, THEORETICAL; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY; X-RAY DIFFRACTION;

EID: 54949097432     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049508023935     Document Type: Article

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