Direct structure determination of systems with two-dimensional periodicity

Journal of Physics Condensed Matter

Volumn 12, Issue 17, 2000, Pages 3929-3938

  Yacoby, Y ^a   Pindak, R ^b   Macharrie, R ^b   Pfeiffer, L ^b   Berman, L ^c   Clarke, R ^d  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b LUCENT TECHNOLOGIES   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001627644     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/12/17/301     Document Type: Article

References (13)

1. Sinha S K, Sanyal M K, Satija S K, Majkrzak C F, Neumann D A, Homma H, Szpala S, Gibaud A and Morkoc H 1994 X-ray scattering studies of surface roughness of GaAs/AlAs multilayers Physica B 198 72-7
2. Miceli P F 1993 X-ray reflectivity from heteroepitaxial layers Semiconductor Interfaces, Microstructures and Devices: Properties and Applications (Bristol: Institute of Physics Publishing) pp 87-114
3. Robinson I K and Tweet D J 1992 Surface x-ray diffraction Rep. Prog. Phys. 55 599-651
4. Morelhao S L and Cardoso L P 1993 Structural properties of heteroepitaxial systems using hybrid multiple diffraction in Renninger scans J. Appl. Phys. 73 4218-26
5. Zegenhagen J 1993 Surface structure determination with x-ray standing waves Surf. Sci. Rep. 18 7-8
6. Sanyal M K, Sinha S K, Gibaud A, Huang K G, Carvalho B L, Rafailovich M, Sokolov J, Zhao X and Zhao W 1993 Fourier reconstruction of density profiles of thin films using anomalous x-ray reflectivity Europhys. Lett. 21 691-6
7. Tegze M and Faigel G 1996 X-ray holography with atomic resolution Nature 380 49-51
8. De S M, De A A, Raoux D, Maurer M, Ravet M F and Piecuch M 1992 Anomalous x-ray diffraction of a hexagonal Fe/Ru superlattice Phys. Rev. B 46 15 465-71
9. Rius J, Miravitlles C and Allmann R 1996 A tangent formula derived from Patterson-function arguments. IV. The solution of difference structures directly from superstructure reflections Acta Crystallogr. A 52 634-9
10. Torrelles X, Rius J, Boscherini F, Heun S, Mueller B H, Ferrer S, Alvarez J and Miravitlles C 1998 Application of x-ray direct methods to surface reconstructions: the solution of projected superstructures Phys. Rev. B 57 R4281-4
11. Torrelles X, Rius J, Miravitlles C and Ferrer S 1999 Application of the 'direct methods' difference sum function to the solution of reconstructed surfaces Surf. Sci. 423 2-3
12. Yacoby Y 1994 Structure factor amplitude and phase determination by a new two beam diffraction interference method Solid State Commun. 91 529-33
13. Baltes H, Yacoby Y, Pindak R, Clarke R, Pfeiffer L and Berman L 1997 Measurement of the x-ray diffraction phase in a 2D crystal Phys. Rev. Lett. 79 1285-8