Imaging the displacement field within epitaxial nanostructures by coherent diffraction: A feasibility study

New Journal of Physics

Volumn 12, Issue , 2010, Pages

  Diaz, Ana ^a,b,e   Chamard, Virginie ^c   Mocuta, Cristian ^d   Magalhães Paniago, Rogerio ^a   Stangl, Julian ^b   Carbone, Dina ^a   Metzger, Till H ^a   Bauer, Günther ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^c AIX MARSEILLE UNIVERSITÉ   (France)

^d SYNCHROTRON SOLEIL   (France)

^e PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; FINITE ELEMENT METHOD; NANOSTRUCTURES;

COHERENT DIFFRACTION; COHERENT DIFFRACTION IMAGING; DISPLACEMENT FIELD; EPITAXIAL NANOCRYSTALS; EPITAXIAL NANOSTRUCTURES; FEASIBILITY STUDIES; FINITE ELEMENT SIMULATIONS; MICRODIFFRACTIONS;

SI-GE ALLOYS;

EID: 77951574574     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/12/3/035006     Document Type: Article

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