Stuctural investigation of InAs nanowires with coherent X-rays

Journal of Strain Analysis for Engineering Design

Volumn 44, Issue 7, 2009, Pages 533-542

  Chamard, V ^a   Diaz, A ^b,c   Stangl, J ^c   Labat, S ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Coherent X ray diffraction; Imaging; Nanoscale; Nanowire; Strain

Indexed keywords

BRAGG DIFFRACTION; COHERENT BEAMS; COHERENT X-RAY DIFFRACTION; COHERENT X-RAY SOURCE; COHERENT X-RAYS; CRYSTALLINE DEFECTS; DISPLACEMENT FIELD; EXPERIMENTAL CHARACTERIZATION; FUTURE PERSPECTIVES; HIGH SENSITIVITY; IMAGING; INAS; INTERNAL STRUCTURE; LENS-LESS IMAGING; NANOSCALE; STRAIN ANALYSIS; THIRD GENERATION;

DIFFRACTION; ELECTRIC WIRE; INDIUM ARSENIDE; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; NANOWIRES; SEMICONDUCTING INDIUM; X RAY DIFFRACTION; X RAY OPTICS; X RAYS;

X RAY DIFFRACTION ANALYSIS;

EID: 70349339388     PISSN: 03093247     EISSN: None     Source Type: Journal    
DOI: 10.1243/03093247JSA573     Document Type: Article

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