Error tolerance of an iterative phase retrieval algorithm for moveable illumination microscopy

Ultramicroscopy

Volumn 103, Issue 2, 2005, Pages 153-164

  Faulkner, H M L ^a   Rodenburg, J M ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Electron microscopy; Iterative algorithms; Phase retrieval; Ptychography; X ray microscopy

Indexed keywords

ACOUSTIC NOISE; ALGORITHMS; FUNCTIONS; PARAMETER ESTIMATION; PROBLEM SOLVING;

ERROR TOLERANCE; ITERATIVE PHASE RETRIEVAL ALGORITHM; SOURCE COHERENCE; WAVEFUNCTIONS;

ITERATIVE METHODS;

ACCURACY; ALGORITHM; ARTICLE; ELECTRON MICROSCOPY; ILLUMINATION; INFORMATION; MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; X RAY;

EID: 14844355545     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.11.006     Document Type: Article

References (10)

1. R.W. Gerchberg, and W.O. Saxton Optik 35 2 1972 237
2. J.R. Fienup Appl. Opt. 21 15 1982 2758
3. J.M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L.A. Nagahara Science 300 2003 1419
4. J. Miao, P. Charalambous, J. Kirz, and D. Sayre Nature 400 1999 342
5. U. Weierstall, Q. Chen, J.C.H. Spence, M.R. Howells, M. Isaacson, and R.R. Panepucci Ultramicroscopy 90 2002 171
6. J.C.H. Spence, U. Weierstall, and M. Howells Phil. Trans. R. Soc. Lond. 360 2002 875
7. R. Hegerl, and W. Hoppe Ber. Bunsenges Phys. Chem. 74 1970 1148
8. P.D. Nellist, and J.M. Rodenburg Acta Cryst. A 54 1998 49
9. J.M. Rodenburg, H.M.L. Faulkner, Appl. Phys. Lett. 85 (20) (2004) 4795
10. H.M.L. Faulkner, and J.M. Rodenburg Phys. Rev. Lett. 93 2 2004 023903