Stereo atomscope and diffraction spectroscopy-Atomic site specific property analysis

Journal of Electron Spectroscopy and Related Phenomena

Volumn 178-179, Issue C, 2010, Pages 221-240

  Matsui, Fumihiko ^a   Matsushita, Tomohiro ^b   Daimon, Hiroshi ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

Circular dichroism; Diffraction spectroscopy; Forward focusing peaks; Photoelectron diffraction; Stereo atomscope; X ray absorption spectroscopy

Indexed keywords

ATOMIC ARRANGEMENT; ATOMIC LAYER; ATOMIC ORBITAL; ATOMIC SITES; ATOMIC STRUCTURE; AUGER ELECTRON; CIRCULAR DICHROISM; CIRCULARLY POLARIZED; CORE LEVELS; CORE-LEVEL SHIFT; DIFFRACTION SPECTROSCOPY; FORWARD-FOCUSING; MAGNETIC CIRCULAR DICHROISM SPECTRA; NI THIN FILMS; ORBITAL ANGULAR MOMENTUM; PHOTOELECTRON DIFFRACTION; QUANTUM NUMBERS; STEREO-PHOTOGRAPHS; STRUCTURE FACTORS; UNIT CELLS;

ABSORPTION; ANGULAR MOMENTUM; ATOMIC SPECTROSCOPY; ATOMS; AUGER ELECTRON SPECTROSCOPY; CIRCULAR DICHROISM SPECTROSCOPY; DICHROISM; FORWARD SCATTERING; LIGHT; MAGNETIC DEVICES; MAGNETIC MOMENTS; MAGNETIC STRUCTURE; PHOTOELECTRONS; PHOTOGRAPHY; PHOTOIONIZATION; PHOTONS; QUANTUM CHEMISTRY; QUANTUM THEORY; SPECTRUM ANALYSIS; VALENCE BANDS; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY; X RAY ANALYSIS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77951023445     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.09.001     Document Type: Article

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