Improvement of display-type spherical mirror analyzer for real space mapping of electronic and atomic structures

Journal of Electron Spectroscopy and Related Phenomena

Volumn 163, Issue 1-3, 2008, Pages 45-50

  Takahashi, Nobuaki ^a   Matsui, Fumihiko ^a,b   Matsuda, Hiroyuki ^a   Hamada, Yoji ^c   Nakanishi, Koji ^c   Namba, Hidetoshi ^c   Daimon, Hiroshi ^a,b,c  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

Angle resolved photoelectron spectroscopy (ARPES); Band dispersion mapping; Scanning Auger electron microscopy (SAM)

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL ORIENTATION; ELECTRON GUNS; SYNCHROTRON RADIATION;

ENERGY RESOLUTION; SCANNING AUGER ELECTRON MICROSCOPY (SAM);

ELECTRONIC STRUCTURE;

EID: 43849104352     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2008.02.004     Document Type: Article

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