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Volumn 54, Issue 3-4, 1997, Pages 341-386

Diffraction and holography with photoelectrons and fluorescent X-rays

(26)  Fadley, C S a,b   Chen, Y b   Couch, R E a   Daimon, H e   Denecke, R a,b   Denlinger, J D f   Galloway, H b,c   Hussaint, Z b   Kaduwela, A P a,b   Kim, Y J a,d   Len, P M a,b   Liesegang, J i   Menchero, J b,c   Morais, J a   Palomares, J a,b   Ruebush, S D a,b   Rotenberg, E g   Salmeron, M B b   Scalettar, R h   Schattke, W a   more..


Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHARACTERIZATION; ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; HOLOGRAPHY; LOW ENERGY ELECTRON DIFFRACTION; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SYNCHROTRON RADIATION; X RAYS;

EID: 0031096447     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0079-6816(97)00013-0     Document Type: Article
Times cited : (65)

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