Probing surface states of Cu/Ni thin films using x-ray absorption spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 11, 2001, Pages

  Karis, O ^a   Magnuson, M ^a,b   Wiell, T ^a   Weinelt, M ^a   Wassdahl, N ^a   Nilsson, A ^a   Martensson N ^a   Holmstrom E ^a   Niklasson, A M N ^a,c   Eriksson, O ^a   Johansson, B ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b SORBONNE UNIVERSITÉ   (France)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER DERIVATIVE; NICKEL;

ABSORPTION SPECTROPHOTOMETRY; ARTICLE; MOLECULAR PHYSICS; ROENTGEN SPECTROSCOPY; SURFACE PROPERTY; SWEDEN;

EID: 0141547679     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.113401     Document Type: Article

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