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Volumn 78, Issue 13, 1997, Pages 2604-2607
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Direct determination of multiple adsorption sites using chemical-shift photoelectron diffraction: Sb/GaAs(110)
a,b c c b,c |
Author keywords
[No Author keywords available]
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Indexed keywords
ADSORPTION;
ANTIMONY;
ATOMS;
CHEMICAL BONDS;
ELECTRON ENERGY LEVELS;
INVERSE PROBLEMS;
MODULATION;
PHOTOELECTRON SPECTROSCOPY;
SEMICONDUCTING GALLIUM ARSENIDE;
SURFACES;
CHEMICAL SHIFT PHOTOELECTRON DIFFRACTION;
EPITAXIAL CONTINUED LAYER STRUCTURE;
MULTIPLE ADSORPTION SITES;
ELECTRON DIFFRACTION;
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EID: 0031096441
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.78.2604 Document Type: Article |
Times cited : (16)
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References (19)
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