Circular dichroism of forward focusing peaks and diffraction rings in 2π steradian Si 2p photoelectron pattern

Applied Surface Science

Volumn 254, Issue 23, 2008, Pages 7549-7552

  Inaji, Kanako ^a   Matsui, Fumihiko ^a,b   Kato, Yukako ^a   Sakai, Chikako ^a   Narikawa, Takashi ^a   Matsushita, Tomohiro ^c   Guo, Fang Zhun ^c   Daimon, Hiroshi ^a,b  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

Circular dichroism; Forward focusing peak; Photoelectron diffraction; Silicon; Stereoatomscope; Surface structure

Indexed keywords

ATOMS; DIFFRACTION; FOCUSING; GEOMETRICAL OPTICS; PHOTOELECTRONS; PHOTONS; SILICON; SURFACE STRUCTURE;

ATOMIC ARRANGEMENT; DIFFRACTION RINGS; FORWARD-FOCUSING; INCIDENT LIGHT; PHOTOELECTRON DIFFRACTION; ROTATIONAL SHIFT; SI(0 0 1) SURFACE; STEREOATOMSCOPE;

DICHROISM;

EID: 51249125046     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.01.025     Document Type: Article

References (15)

1. Daimon H. Phys. Rev. B 58 (1998) 9662
2. Chassé A., and Rennert P. Phys. Rev. B 55 (1997) 4120
3. Daimon H. Phys. Rev. Lett. 86 (2001) 2034
4. Matsui F., Daimon H., Guo F.Z., and Matsushita T. Appl. Phys. Lett. 85 (2004) 3737
5. Kato Y., Matsui F., Matsushita T., Guo F.Z., and Daimon H. Appl. Phys. Lett. 91 (2007) 251914
6. Matsushita T., Guo F.Z., Muro T., Matsui F., and Daimon H. AIP Conf. Proc. 879 (2007) 1164-1167
7. Saitoh Y., Kimura H., Suzuki Y., Nakatani T., Matsushita T., Muro T., Miyahara T., Fujisawa M., Soda K., Ueda S., Harada H., Kotsugi M., Sekiyama A., and Suga S. Rev. Sci. Instrum. 71 (2000) 3254
8. Daimon H. Rev. Sci. Instrum. 59 (1988) 545
9. Daimon H., and Ino S. Rev. Sci. Instrum. 61 (1990) 57
10. Kotsugi M. Nuclear Instrum. Methods Phys. Res. A 467-468 (2001) 1493
11. Matsui F., Matsushita T., Kato Y., Guo F.Z., and Daimon H. J. Phys. Soc. Jpn. 76 (2007) 013705
12. Matsushita T., Guo F.Z., Matsui F., Kato Y., and Daimon H. Phys. Rev. B 75 (2007) 085419
13. Sakai C., Matsui F., Matsushita T., Kato Y., Narikawa T., and Daimon H. e-J. Surf. Sci. Nanotechnol. 5 (2007) 143
14. Muro T., Nakamura T., Matsushita T., Kimura H., Nakatani T., Hirono T., Kudo T., Kobayashi K., Saitoh Y., Takeuchi M., Hara T., Shirasawa K., and Kitamura H. J. Electron Spectrosc. Related Phenomena 144 (2005) 1101
15. Daimon H., and Ino S. Surf. Sci. 222 (1989) 274